STMicroelectronics M24256-BFMC6TG, 256 kB EEPROM, 450 ns 8-Pin UFDFPN Serial-I2C

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Sous-total (1 paquet de 25 unités)*

9,175 €

(TVA exclue)

11,10 €

(TVA incluse)

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  • Expédition à partir du 17 mars 2026
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Prix par unité
le paquet*
25 - 250,367 €9,18 €
50 - 4750,36 €9,00 €
500 - 9750,334 €8,35 €
1000 - 24750,325 €8,13 €
2500 +0,317 €7,93 €

*Prix donné à titre indicatif

Options de conditionnement :
N° de stock RS:
190-7577
Référence fabricant:
M24256-BFMC6TG
Fabricant:
STMicroelectronics
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Marque

STMicroelectronics

Product Type

EEPROM

Memory Size

256kB

Interface Type

Serial-I2C

Package Type

UFDFPN

Mount Type

Surface

Pin Count

8

Organisation

32K x 8 Bit

Maximum Clock Frequency

1MHz

Minimum Supply Voltage

1.7V

Number of Bits per Word

8

Maximum Supply Voltage

5.5V

Minimum Operating Temperature

-40°C

Maximum Operating Temperature

85°C

Standards/Approvals

RoHS 2011/65/EU

Width

3 mm

Series

M24256

Height

0.6mm

Length

2.1mm

Maximum Random Access Time

450ns

Number of Words

32k

Automotive Standard

AEC-Q100

Supply Current

2.5mA

Data Retention

200year

The M24256-BW can operate with a supply voltage from 2.5 V to 5.5 V, the M24256-BR and M24256-DR can operate with a supply voltage from 1.8 V to 5.5 V, and the M24256-BF and M24256-DF can operate with a supply voltage from 1.7 V to 5.5 V. All these devices operate with a clock frequency of 1 MHz (or less), over an ambient temperature range of –40 °C / +85 °C.

Compatible with all I2C bus modes:

1 MHz

400 kHz

100 kHz

Memory array:

256 Kbit (32 Kbyte) of EEPROM

Page size: 64 byte

Additional Write lockable page

Single supply voltage and high speed:

1 MHz clock from 1.7 V to 5.5 V

Write:

Byte Write within 5 ms

Page Write within 5 ms

Operating temperature range:

from -40 °C up to +85 °C

Random and sequential Read modes

Write protect of the whole memory array

Enhanced ESD/Latch-Up protection

More than 4 million Write cycles

More than 200-years data retention

Packages

SO8

TSSOP8

UFDFPN8

WLCSP

Unsawn wafer (each die is tested)

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